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	Compositional correlation and polymorphism in BaF2-PrF3 thin films deposited using electron-beam evaporation
	He, Weixiang; Zheng, Weimin; Xie, Ping; Li, Bin; Lv, Xuwen; Jing, Chao; Liu, Dingquan
刊名	THIN SOLID FILMS
	2019
卷号	669页码:558-563
关键词	Infrared low -index evaporation materials BaF2-PrF3 Electron beam evaporation Compositional correlation Polymorphism
DOI	10.1016/j.tsf.2018.11.056
URL标识	查看原文
公开日期	[db:dc_date_available]
内容类型	期刊论文
URI标识	http://www.corc.org.cn/handle/1471x/4530682
专题	山东大学
作者单位	1.Shanghai Univ, Dept Phys, Shanghai 200444, Peoples R China. 2.Shandong Univ, Sch Space Sci & Ph
推荐引用方式 GB/T 7714	He, Weixiang,Zheng, Weimin,Xie, Ping,et al. Compositional correlation and polymorphism in BaF2-PrF3 thin films deposited using electron-beam evaporation[J]. THIN SOLID FILMS,2019,669:558-563.
APA	He, Weixiang.,Zheng, Weimin.,Xie, Ping.,Li, Bin.,Lv, Xuwen.,...&Liu, Dingquan.(2019).Compositional correlation and polymorphism in BaF2-PrF3 thin films deposited using electron-beam evaporation.THIN SOLID FILMS,669,558-563.
MLA	He, Weixiang,et al."Compositional correlation and polymorphism in BaF2-PrF3 thin films deposited using electron-beam evaporation".THIN SOLID FILMS 669(2019):558-563.

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