| Vegetation phenology from multi-temporal EOS MODIS data | |
| Yu X. F. ; Zhuang D. F. ; Chen S. Q. ; Hou X. Y. ; Chen H. | |
| 2004 | |
| 会议名称 | Proceedings of the Society of Photo-Optical Instrumentation Engineers (Spie) |
| 关键词 | vegetation phenology EOS MODIS NDVI growing season satellite imagery growing-season sensor data china variability region index |
| 页码 | 185-193 |
| 英文摘要 | Vegetation phenology is an important variable in a wide variety of Earth and atmospheric science applications. The role of remote sensing in phenological studies is increasingly regarded as a key to understanding large area seasonal phenomena. This paper describes the application of Moderate Resolution Imaging Spectroradiometer (MODIS) time series data for forest phenology analysis. The phenology of forest covering Northeast China and its spatial characteristics were investigated using MODIS normalized difference vegetation index (NDVI) data. Threshold-based method was used to estimate three key forest phenological variables: start of growing season (SOS), end of growing season (EOS) and the growing season length (GSL). The spatial pattern of key phenological stages were mapped and analyzed. The derived phenological variables were validated by referring to previous research achievements in this study area. The phenological pattern of Changbaishan Reserve was compared with the distribution of forest types. Results indicate that spatial characteristics of vegetation phenology are corresponding with the distribution of vegetation types and the phenology information can be used to improve vegetation classification accuracy as an auxiliary variable. |
| 收录类别 | CPCI |
| 会议录出版者 | Spie-Int Soc Optical Engineering |
| 语种 | 英语 |
| ISSN号 | 0277-786X |
| ISBN号 | 0-8194-5487-7 |
| 内容类型 | 会议论文 |
| 源URL | [http://ir.igsnrr.ac.cn/handle/311030/25370]  |
| 专题 | 地理科学与资源研究所_历年回溯文献 |
| 推荐引用方式 GB/T 7714 | Yu X. F.,Zhuang D. F.,Chen S. Q.,et al. Vegetation phenology from multi-temporal EOS MODIS data[C]. 见:Proceedings of the Society of Photo-Optical Instrumentation Engineers (Spie). |
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