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Crack-free Al0.5Ga0.5N epilayer grown on SiC substrate by in situ SiNx interlayer
Tao, Pengcheng; Liang, Hongwei; Xia, Xiaochuan; Chen, Yuanpeng; Yang, Chao; Liu, Jianxun; Zhu, Zhifu; Liu, Yang; Shen, Rensheng; Luo, Yingmin
刊名MATERIALS SCIENCE IN SEMICONDUCTOR PROCESSING
2016
卷号41页码:291-296
关键词SiC AlGaN SiNx interlayer Metal organic chemical vapor deposition
ISSN号1369-8001
URL标识查看原文
内容类型期刊论文
URI标识http://www.corc.org.cn/handle/1471x/4365013
专题大连理工大学
作者单位1.Dalian Univ Technol, Sch Phys & Optoelect Engn, Dalian 116024, Peoples R China.
2.Jilin Univ, Sch Elect Sci & Engn, State Key Lab Integrated Optoelect, Changchun 130012, Peoples R China.
3.Dalian Univ Technol, Sch Phys & Optoelect Engn, Dalian 116024, Peoples R China.
4.Jilin Univ, Sch Elect Sci & Engn, State Key Lab Integrated Optoelect, Changchun 130012, Peoples R China.
推荐引用方式
GB/T 7714
Tao, Pengcheng,Liang, Hongwei,Xia, Xiaochuan,et al. Crack-free Al0.5Ga0.5N epilayer grown on SiC substrate by in situ SiNx interlayer[J]. MATERIALS SCIENCE IN SEMICONDUCTOR PROCESSING,2016,41:291-296.
APA Tao, Pengcheng.,Liang, Hongwei.,Xia, Xiaochuan.,Chen, Yuanpeng.,Yang, Chao.,...&Du, Guotong.(2016).Crack-free Al0.5Ga0.5N epilayer grown on SiC substrate by in situ SiNx interlayer.MATERIALS SCIENCE IN SEMICONDUCTOR PROCESSING,41,291-296.
MLA Tao, Pengcheng,et al."Crack-free Al0.5Ga0.5N epilayer grown on SiC substrate by in situ SiNx interlayer".MATERIALS SCIENCE IN SEMICONDUCTOR PROCESSING 41(2016):291-296.
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