A comparative investigation of trap-limited hole transport properties in organic bulk heterojunctions

	A comparative investigation of trap-limited hole transport properties in organic bulk heterojunctions
	Li BX ; Chen JS ; Yang DZ ; Ma DG
刊名	semiconductor science and technology
	2011
卷号	26 期号:11
关键词	CHARGE-CARRIER TRANSPORT SEMICONDUCTOR BLENDS DEPENDENCE ELECTRON FILMS
ISSN号	0268-1242
通讯作者	ma dg
中文摘要	we have investigated the bulk hole transport properties of copper phthalocyanine (cupc): fullerene (c(60)) and zinc phthalocyanine (znpc):c(60) bulk heterojunctions by analyzing thickness-and temperature-dependent current density-voltage (j-v) characteristics in hole-only device configurations, i.e. indium-tin-oxide (ito)/poly(ethylene-dioxythiophene): polystyrenesulphonate (pedot:pss)/cupc: c(60) or znpc:c(60)/molybdenum oxide (moo(3))/al. it has been found that the hole transport is governed by a space-charge-limited current (sclc) model in the presence of exponentially distributed traps within the bandgap. the hole mobility of cupc: c60 mixture (1 x 10(-5) cm(2) v(-1) s(-1)) is higher than that of znpc:c(60) mixture (6.2 x 10(-6) cm(2) v(-1) s(-1)), which can be ascribed to the differences of the characteristic trap energy and the total density of traps in both bulk heterojunctions. these results indicate that the sclc method is applicable for studying the transport properties in organic bulk heterojunction.
收录类别	SCI收录期刊论文
语种	英语
WOS记录号	WOS:000296768400006
公开日期	2012-06-08
内容类型	期刊论文
源URL	[http://ir.ciac.jl.cn/handle/322003/44257]
专题	长春应用化学研究所_长春应用化学研究所知识产出_期刊论文
推荐引用方式 GB/T 7714	Li BX,Chen JS,Yang DZ,et al. A comparative investigation of trap-limited hole transport properties in organic bulk heterojunctions[J]. semiconductor science and technology,2011,26(11).
APA	Li BX,Chen JS,Yang DZ,&Ma DG.(2011).A comparative investigation of trap-limited hole transport properties in organic bulk heterojunctions.semiconductor science and technology,26(11).
MLA	Li BX,et al."A comparative investigation of trap-limited hole transport properties in organic bulk heterojunctions".semiconductor science and technology 26.11(2011).