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	Atomistic insight into ordered defect superstructures at novel grain boundaries in CuO nanosheets: From structures to electronic properties
	Zhao, Lulu; Li, Lei; Sheng, Huaping; Zheng, He; Jia, Shuangfeng; Meng, Weiwei; Liu, Huihui; Cao, Fan; Peng, Huayu; Wang, Jianbo
刊名	NANO RESEARCH
	2019
卷号	12期号:5
关键词	grain boundaries atomistic structure electronic property scanning transmission electron microscopy (STEM) first-principles
ISSN号	1998-0124
DOI	10.1007/s12274-019-2354-3
URL标识	查看原文
收录类别	SCIE
语种	英语
内容类型	期刊论文
URI标识	http://www.corc.org.cn/handle/1471x/4214914
专题	武汉大学
推荐引用方式 GB/T 7714	Zhao, Lulu,Li, Lei,Sheng, Huaping,et al. Atomistic insight into ordered defect superstructures at novel grain boundaries in CuO nanosheets: From structures to electronic properties[J]. NANO RESEARCH,2019,12(5).
APA	Zhao, Lulu.,Li, Lei.,Sheng, Huaping.,Zheng, He.,Jia, Shuangfeng.,...&Wang, Jianbo.(2019).Atomistic insight into ordered defect superstructures at novel grain boundaries in CuO nanosheets: From structures to electronic properties.NANO RESEARCH,12(5).
MLA	Zhao, Lulu,et al."Atomistic insight into ordered defect superstructures at novel grain boundaries in CuO nanosheets: From structures to electronic properties".NANO RESEARCH 12.5(2019).

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