Cross-project and Within-project Semi-supervised Software Defect Prediction Problems Study Using a Unified Solution | |
Wu, Fei; Jing, Xiao-Yuan; Dong, Xiwei; Cao, Jicheng; Xu, Mingwei; Zhang, Hongyu; Ying, Shi; Xu, Baowen | |
2017 | |
关键词 | cross-project semi-supervised defect prediction within-project semi-supervised defect prediction semi-supervised structured dictionary learning |
ISSN号 | 2574-1926 |
URL标识 | 查看原文 |
语种 | 英语 |
出处 | PROCEEDINGS OF THE 2017 IEEE/ACM 39TH INTERNATIONAL CONFERENCE ON SOFTWARE ENGINEERING COMPANION (ICSE-C 2017) |
DOI标识 | 10.1109/ICSE-C.2017.72 |
收录类别 | CPCI-S |
内容类型 | 其他 |
URI标识 | http://www.corc.org.cn/handle/1471x/4191823 |
专题 | 武汉大学 |
推荐引用方式 GB/T 7714 | Wu, Fei,Jing, Xiao-Yuan,Dong, Xiwei,et al. Cross-project and Within-project Semi-supervised Software Defect Prediction Problems Study Using a Unified Solution. 2017-01-01. |
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