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	Positron Annihilation Study of Ternary Sb2Te3-x Se (x) for Its Tuning Electrical and Thermal Properties
	Zheng, Wenwen; Yang, Dongwang; Bi, Peng; He, Chunqing; Liu, Fengming; Shi, Jing; Ding, Yi; Wang, Ziyu; Xiong, Rui
刊名	JOURNAL OF ELECTRONIC MATERIALS
	2017
卷号	46期号:5
关键词	Thermoelectric materials positron annihilation electrical property thermal property point defects carrier concentration
ISSN号	0361-5235
DOI	10.1007/s11664-016-5058-4
URL标识	查看原文
收录类别	CPCI-S
语种	英语
内容类型	期刊论文
URI标识	http://www.corc.org.cn/handle/1471x/4177618
专题	武汉大学
推荐引用方式 GB/T 7714	Zheng, Wenwen,Yang, Dongwang,Bi, Peng,et al. Positron Annihilation Study of Ternary Sb2Te3-x Se (x) for Its Tuning Electrical and Thermal Properties[J]. JOURNAL OF ELECTRONIC MATERIALS,2017,46(5).
APA	Zheng, Wenwen.,Yang, Dongwang.,Bi, Peng.,He, Chunqing.,Liu, Fengming.,...&Xiong, Rui.(2017).Positron Annihilation Study of Ternary Sb2Te3-x Se (x) for Its Tuning Electrical and Thermal Properties.JOURNAL OF ELECTRONIC MATERIALS,46(5).
MLA	Zheng, Wenwen,et al."Positron Annihilation Study of Ternary Sb2Te3-x Se (x) for Its Tuning Electrical and Thermal Properties".JOURNAL OF ELECTRONIC MATERIALS 46.5(2017).

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