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	Interface defect detection for composite insulators based on infrared thermography axial temperature method
	Wang, Jianguo; Xiao, Xiong; Fan, Yadong; Cai, Li; Tong, Yao; Rao, Zhangquan; Huang, Zhen
刊名	Infrared Physics and Technology
	2018
卷号	93
ISSN号	1350-4495
DOI	10.1016/j.infrared.2018.07.039
URL标识	查看原文
收录类别	EI
语种	英语
内容类型	期刊论文
URI标识	http://www.corc.org.cn/handle/1471x/4157105
专题	武汉大学
推荐引用方式 GB/T 7714	Wang, Jianguo,Xiao, Xiong,Fan, Yadong,et al. Interface defect detection for composite insulators based on infrared thermography axial temperature method[J]. Infrared Physics and Technology,2018,93.
APA	Wang, Jianguo.,Xiao, Xiong.,Fan, Yadong.,Cai, Li.,Tong, Yao.,...&Huang, Zhen.(2018).Interface defect detection for composite insulators based on infrared thermography axial temperature method.Infrared Physics and Technology,93.
MLA	Wang, Jianguo,et al."Interface defect detection for composite insulators based on infrared thermography axial temperature method".Infrared Physics and Technology 93(2018).

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