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	Cross-Project and Within-Project Semisupervised Software Defect Prediction: A Unified Approach
	Wu, Fei; Jing, Xiao-Yuan; Sun, Ying; Sun, Jing; Huang, Lin; Cui, Fangyi; Sun, Yanfei
刊名	IEEE TRANSACTIONS ON RELIABILITY
	2018
卷号	67期号:2
关键词	Cost-sensitive kernelized semisupervised dictionary learning (CKSDL) cross-project semisupervised defect prediction (CSDP) within-project semisupervised defect prediction (WSDP)
ISSN号	0018-9529
DOI	10.1109/TR.2018.2804922
URL标识	查看原文
收录类别	SCIE ; EI
语种	英语
内容类型	期刊论文
URI标识	http://www.corc.org.cn/handle/1471x/4154283
专题	武汉大学
推荐引用方式 GB/T 7714	Wu, Fei,Jing, Xiao-Yuan,Sun, Ying,et al. Cross-Project and Within-Project Semisupervised Software Defect Prediction: A Unified Approach[J]. IEEE TRANSACTIONS ON RELIABILITY,2018,67(2).
APA	Wu, Fei.,Jing, Xiao-Yuan.,Sun, Ying.,Sun, Jing.,Huang, Lin.,...&Sun, Yanfei.(2018).Cross-Project and Within-Project Semisupervised Software Defect Prediction: A Unified Approach.IEEE TRANSACTIONS ON RELIABILITY,67(2).
MLA	Wu, Fei,et al."Cross-Project and Within-Project Semisupervised Software Defect Prediction: A Unified Approach".IEEE TRANSACTIONS ON RELIABILITY 67.2(2018).

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