On the accuracy of maximum entropy reconstruction of high-resolution Z-contrast STEM images

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	On the accuracy of maximum entropy reconstruction of high-resolution Z-contrast STEM images
	X. H. Sang ; K. Du ; M. J. Zhuo ; H. Q. Ye
刊名	Micron
	2009
卷号	40 期号:2 页码:247-254
关键词	Scanning transmission electron microscopy High-angle annular dark-field image (HAADF) Image processing Quantitative electron microscopy transmission electron-microscopy dark-field images grain-boundaries adf stem chemistry silicon
ISSN号	0968-4328
中文摘要	The accuracy of maximum entropy reconstruction of Z-contrast STEM images has been evaluated with the effects of experimental variables and noise taken into account by the means of image simulation. As the specimen contains atom species of greatly different atomic numbers, special attention is given to the reliability of the position and composition of lighter atoms that are determined from Z-contrast images in the presence of heavier atoms. When the noise is moderate (SNR > 2.5), the position of atom columns can be measured within an accuracy of 0.03 nm. With a higher signal-to-noise ratio (SNR > 5) the composition of lighter atoms can be resolved reliably from the Z-contrast images. However, when image noise increases, the relative intensity of lighter atoms may deviate from the actual value in the specimen object function. (c) 2008 Elsevier Ltd. All rights reserved.
原文出处	://WOS:000262072000011
公开日期	2012-04-13
内容类型	期刊论文
源URL	[http://210.72.142.130/handle/321006/32259]
专题	金属研究所_中国科学院金属研究所
推荐引用方式 GB/T 7714	X. H. Sang,K. Du,M. J. Zhuo,et al. On the accuracy of maximum entropy reconstruction of high-resolution Z-contrast STEM images[J]. Micron,2009,40(2):247-254.
APA	X. H. Sang,K. Du,M. J. Zhuo,&H. Q. Ye.(2009).On the accuracy of maximum entropy reconstruction of high-resolution Z-contrast STEM images.Micron,40(2),247-254.
MLA	X. H. Sang,et al."On the accuracy of maximum entropy reconstruction of high-resolution Z-contrast STEM images".Micron 40.2(2009):247-254.