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	Numerical and experimental investigation of GaN-based flip-chip light-emitting diodes with highly reflective Ag/TiW and ITO/DBR Ohmic contacts
	Zhou, Shengjun; Liu, Xingtong; Gao, Yilin; Liu, Yingce; Liu, Mengling; Liu, Zongyuan; Gui, Chengqun; Liu, Sheng
刊名	OPTICS EXPRESS
	2017
卷号	25期号:22
ISSN号	1094-4087
DOI	10.1364/OE.25.026615
URL标识	查看原文
收录类别	SCIE ; EI
语种	英语
内容类型	期刊论文
URI标识	http://www.corc.org.cn/handle/1471x/4089190
专题	武汉大学
推荐引用方式 GB/T 7714	Zhou, Shengjun,Liu, Xingtong,Gao, Yilin,et al. Numerical and experimental investigation of GaN-based flip-chip light-emitting diodes with highly reflective Ag/TiW and ITO/DBR Ohmic contacts[J]. OPTICS EXPRESS,2017,25(22).
APA	Zhou, Shengjun.,Liu, Xingtong.,Gao, Yilin.,Liu, Yingce.,Liu, Mengling.,...&Liu, Sheng.(2017).Numerical and experimental investigation of GaN-based flip-chip light-emitting diodes with highly reflective Ag/TiW and ITO/DBR Ohmic contacts.OPTICS EXPRESS,25(22).
MLA	Zhou, Shengjun,et al."Numerical and experimental investigation of GaN-based flip-chip light-emitting diodes with highly reflective Ag/TiW and ITO/DBR Ohmic contacts".OPTICS EXPRESS 25.22(2017).

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