Simultaneous Formation Of Through Wafer Electrical Interconnects And Highly Dense & Uniform Nickel Tips For Silicon-Cantilever Probe-Cards,
Fei Wang, Xinxin Li, Songlin Feng,
2007
会议名称Transducers’07---The 14th International Conference on Solid State Sensors, Actuators and Microsystems
会议日期2007
页码2051-2054
语种英语
内容类型会议论文
源URL[http://ir.sim.ac.cn/handle/331004/107615]  
专题上海微系统与信息技术研究所_传感技术联合国家重点实验室_会议论文
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Fei Wang, Xinxin Li, Songlin Feng,. Simultaneous Formation Of Through Wafer Electrical Interconnects And Highly Dense & Uniform Nickel Tips For Silicon-Cantilever Probe-Cards,[C]. 见:Transducers’07---The 14th International Conference on Solid State Sensors, Actuators and Microsystems. 2007.
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