Metal-Grating-Coupled Terahertz Quantum-Well Photodetectors

	Metal-Grating-Coupled Terahertz Quantum-Well Photodetectors
	Zhang,R ; Guo,XG ; Song,CY ; Buchanan,M ; Wasilewski,ZR ; Cao,JC ; Liu,HC
刊名	IEEE ELECTRON DEVICE LETTERS
	2011
卷号	32 期号:5 页码:659-661
关键词	IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC
ISSN号	0741-3106
学科主题	Engineering ; Electrical & Electronic
公开日期	2012-04-10
内容类型	期刊论文
源URL	[http://ir.sim.ac.cn/handle/331004/106793]
专题	上海微系统与信息技术研究所_功能材料与器件_期刊论文
推荐引用方式 GB/T 7714	Zhang,R,Guo,XG,Song,CY,et al. Metal-Grating-Coupled Terahertz Quantum-Well Photodetectors[J]. IEEE ELECTRON DEVICE LETTERS,2011,32(5):659-661.
APA	Zhang,R.,Guo,XG.,Song,CY.,Buchanan,M.,Wasilewski,ZR.,...&Liu,HC.(2011).Metal-Grating-Coupled Terahertz Quantum-Well Photodetectors.IEEE ELECTRON DEVICE LETTERS,32(5),659-661.
MLA	Zhang,R,et al."Metal-Grating-Coupled Terahertz Quantum-Well Photodetectors".IEEE ELECTRON DEVICE LETTERS 32.5(2011):659-661.