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	Halogen-induced internal heavy-atom effect shortening the emissive lifetime and improving the fluorescence efficiency of thermally activated delayed fluorescence emitters
	Xiang, Yepeng; Zhao, Yongbiao; Xu, Nan; Gong, Shaolong; Ni, Fan; Wu, Kailong; Luo, Jiajia; Xie, Guohua; Lu, Zheng-Hong; Yang, Chuluo
刊名	JOURNAL OF MATERIALS CHEMISTRY C
	2017
卷号	5期号:46
ISSN号	2050-7526
DOI	10.1039/c7tc04181k
URL标识	查看原文
收录类别	SCIE ; EI
语种	英语
内容类型	期刊论文
URI标识	http://www.corc.org.cn/handle/1471x/3892603
专题	武汉大学
推荐引用方式 GB/T 7714	Xiang, Yepeng,Zhao, Yongbiao,Xu, Nan,et al. Halogen-induced internal heavy-atom effect shortening the emissive lifetime and improving the fluorescence efficiency of thermally activated delayed fluorescence emitters[J]. JOURNAL OF MATERIALS CHEMISTRY C,2017,5(46).
APA	Xiang, Yepeng.,Zhao, Yongbiao.,Xu, Nan.,Gong, Shaolong.,Ni, Fan.,...&Yang, Chuluo.(2017).Halogen-induced internal heavy-atom effect shortening the emissive lifetime and improving the fluorescence efficiency of thermally activated delayed fluorescence emitters.JOURNAL OF MATERIALS CHEMISTRY C,5(46).
MLA	Xiang, Yepeng,et al."Halogen-induced internal heavy-atom effect shortening the emissive lifetime and improving the fluorescence efficiency of thermally activated delayed fluorescence emitters".JOURNAL OF MATERIALS CHEMISTRY C 5.46(2017).

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