In-plane texture study of the Yttria-stabilized Zirconia films fabricated by ion-beam-assisted deposition
Yuan,J ; Yang,GQ ; Mao,YJ ; Ren,XC ; Liu,XH ; Zou,SC
刊名ION IMPLANTATION TECHNOLOGY - 96
1997
期号0页码:729-732
通讯作者Yuan, J, CHINESE ACAD SCI,SHANGHAI INST MET,ION BEAM LAB,SHANGHAI 200050,PEOPLES R CHINA
学科主题Engineering ; Electrical & Electronic; Materials Science ; Multidisciplinary
收录类别SCI
原文出处http://apps.webofknowledge.com/full_record.do?product=WOS&search_mode=GeneralSearch&qid=156&SID=T1bBjPaMHA4PI3h27lN&page=1&doc=1
公开日期2012-03-25
内容类型期刊论文
源URL[http://ir.sim.ac.cn/handle/331004/98890]  
专题上海微系统与信息技术研究所_功能材料与器件_期刊论文(1999年以前)
推荐引用方式
GB/T 7714
Yuan,J,Yang,GQ,Mao,YJ,et al. In-plane texture study of the Yttria-stabilized Zirconia films fabricated by ion-beam-assisted deposition[J]. ION IMPLANTATION TECHNOLOGY - 96,1997(0):729-732.
APA Yuan,J,Yang,GQ,Mao,YJ,Ren,XC,Liu,XH,&Zou,SC.(1997).In-plane texture study of the Yttria-stabilized Zirconia films fabricated by ion-beam-assisted deposition.ION IMPLANTATION TECHNOLOGY - 96(0),729-732.
MLA Yuan,J,et al."In-plane texture study of the Yttria-stabilized Zirconia films fabricated by ion-beam-assisted deposition".ION IMPLANTATION TECHNOLOGY - 96 .0(1997):729-732.
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