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	Effects of annealing temperature on structure and electrical properties of sol–gel derived 0.65PMN-0.35PT thin film
	Zhou, Dingguo; Sun, Huajun; Liu, Xiaofang; Sui, Huiting; Guo, Qinghu; Liu, Pengdong; Ruan, Yong*
刊名	Ceramics International
	2017
卷号	43期号:8页码:5901-5906
关键词	A. Sol-gel processes C. Dielectric properties Ferroelectric properties
ISSN号	0272-8842
DOI	10.1016/j.ceramint.2017.01.077
URL标识	查看原文
WOS记录号	WOS:000401401500009;EI:20170703339730
内容类型	期刊论文
URI标识	http://www.corc.org.cn/handle/1471x/3377014
专题	武汉理工大学
作者单位	1.[Liu, Pengdong 2.Zhou, Dingguo 3.Guo, Qinghu 4.Sun, Huajun] Wuhan Univ Technol, Sch Mat Sci & Engn, Wuhan 430070, Peoples R China.
推荐引用方式 GB/T 7714	Zhou, Dingguo,Sun, Huajun,Liu, Xiaofang,et al. Effects of annealing temperature on structure and electrical properties of sol–gel derived 0.65PMN-0.35PT thin film[J]. Ceramics International,2017,43(8):5901-5906.
APA	Zhou, Dingguo.,Sun, Huajun.,Liu, Xiaofang.,Sui, Huiting.,Guo, Qinghu.,...&Ruan, Yong*.(2017).Effects of annealing temperature on structure and electrical properties of sol–gel derived 0.65PMN-0.35PT thin film.Ceramics International,43(8),5901-5906.
MLA	Zhou, Dingguo,et al."Effects of annealing temperature on structure and electrical properties of sol–gel derived 0.65PMN-0.35PT thin film".Ceramics International 43.8(2017):5901-5906.

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