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Microstructure characterization and thermal properties of hypereutectic Si-Al alloy for electronic packaging applications
Yu Kun*; Li Shaojun; Chen Lisan; Zhao Weishang; Li Pengfei
刊名Transactions of Nonferrous Metals Society of China
2012
卷号22期号:6页码:1412-1417
关键词Si-Al alloy rapid solidification thermal properties electronic packaging application
ISSN号1003-6326
DOI10.1016/S1003-6326(11)61334-4
URL标识查看原文
WOS记录号WOS:000306275100022;EI:20122915252957
内容类型期刊论文
URI标识http://www.corc.org.cn/handle/1471x/3339248
专题中南大学
作者单位1.[Li Shaojun
2.Yu Kun] Cent S Univ, Sch Mat Sci & Engn, Changsha 410083, Hunan, Peoples R China.
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GB/T 7714
Yu Kun*,Li Shaojun,Chen Lisan,et al. Microstructure characterization and thermal properties of hypereutectic Si-Al alloy for electronic packaging applications[J]. Transactions of Nonferrous Metals Society of China,2012,22(6):1412-1417.
APA Yu Kun*,Li Shaojun,Chen Lisan,Zhao Weishang,&Li Pengfei.(2012).Microstructure characterization and thermal properties of hypereutectic Si-Al alloy for electronic packaging applications.Transactions of Nonferrous Metals Society of China,22(6),1412-1417.
MLA Yu Kun*,et al."Microstructure characterization and thermal properties of hypereutectic Si-Al alloy for electronic packaging applications".Transactions of Nonferrous Metals Society of China 22.6(2012):1412-1417.
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