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	Brain structural abnormalities as potential markers for detecting individuals with ultra-high risk for psychosis: A systematic review and meta-analysis
	Ding, Yudan; Ou, Yangpan; Pan, Pan; Shan, Xiaoxiao; Chen, Jindong; Liu, Feng; Zhao, Jingping; Guo, Wenbin*
刊名	Schizophrenia research
	2019
卷号	209页码:22-31
关键词	Cortical thickness Neuroimaging Schizophrenia Ultra-high risk for psychosis Voxel-based morphometry
ISSN号	0920-9964
DOI	10.1016/j.schres.2019.05.015
URL标识	查看原文
WOS记录号	WOS:000476868700003
内容类型	期刊论文
URI标识	http://www.corc.org.cn/handle/1471x/3326387
专题	中南大学
作者单位	1.[Shan, Xiaoxiao 2.Guo, Wenbin 3.Pan, Pan 4.Ou, Yangpan 5.Ding, Yudan 6.Zhao, Jingping 7.Chen, Jindong] Cent S Univ, Xiangya Hosp 2, Dept Psychiat, Changsha 410011, Hunan, Peoples R China.
推荐引用方式 GB/T 7714	Ding, Yudan,Ou, Yangpan,Pan, Pan,et al. Brain structural abnormalities as potential markers for detecting individuals with ultra-high risk for psychosis: A systematic review and meta-analysis[J]. Schizophrenia research,2019,209:22-31.
APA	Ding, Yudan.,Ou, Yangpan.,Pan, Pan.,Shan, Xiaoxiao.,Chen, Jindong.,...&Guo, Wenbin*.(2019).Brain structural abnormalities as potential markers for detecting individuals with ultra-high risk for psychosis: A systematic review and meta-analysis.Schizophrenia research,209,22-31.
MLA	Ding, Yudan,et al."Brain structural abnormalities as potential markers for detecting individuals with ultra-high risk for psychosis: A systematic review and meta-analysis".Schizophrenia research 209(2019):22-31.

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