| Multiharmonics Method Characterizing In-Plane Thermal Conductivity and TBR of Semiconductor Nanofilm on Substrate: Theoretical Analysis | |
| Wang, Zhaoliang; Xu, Zhe; Du, Xiaoli; Tang, Dawei | |
| 刊名 | INTERNATIONAL JOURNAL OF THERMOPHYSICS
 |
| 2017 | |
| 卷号 | 38 |
| 关键词 | In-plane thermal conductivity Multiharmonics Semiconductor nanofilm Thermal boundary resistance |
| ISSN号 | 0195-928X |
| URL标识 | 查看原文 |
| WOS记录号 | [DB:DC_IDENTIFIER_WOSID] |
| 内容类型 | 期刊论文 |
| URI标识 | http://www.corc.org.cn/handle/1471x/3281834 |
| 专题 | 大连理工大学 |
| 作者单位 | 1.China Univ Petr, Energy & Power Engn Dept, Qingdao 266580, Peoples R China. 2.Dalian Univ Technol, Inst Energy & Power Engn, Dalian 116024, Peoples R China. |
| 推荐引用方式 GB/T 7714 | Wang, Zhaoliang,Xu, Zhe,Du, Xiaoli,et al. Multiharmonics Method Characterizing In-Plane Thermal Conductivity and TBR of Semiconductor Nanofilm on Substrate: Theoretical Analysis[J]. INTERNATIONAL JOURNAL OF THERMOPHYSICS,2017,38. |
| APA | Wang, Zhaoliang,Xu, Zhe,Du, Xiaoli,&Tang, Dawei.(2017).Multiharmonics Method Characterizing In-Plane Thermal Conductivity and TBR of Semiconductor Nanofilm on Substrate: Theoretical Analysis.INTERNATIONAL JOURNAL OF THERMOPHYSICS,38. |
| MLA | Wang, Zhaoliang,et al."Multiharmonics Method Characterizing In-Plane Thermal Conductivity and TBR of Semiconductor Nanofilm on Substrate: Theoretical Analysis".INTERNATIONAL JOURNAL OF THERMOPHYSICS 38(2017). |
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