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	Polarization fatigue in antiferroelectric (Pb,La)(Zr,Ti)O-3 thin films: The role of the effective strength of driving waveform
	Geng, Wenping; Liu, Yang; Lou, Xiaojie; Zhang, Fuping; Liu, Qida; Dkhil, Brahim; Zhang, Ming; Ren, Xiaobing; He, Hongliang; Jiang, Anquan
刊名	CERAMICS INTERNATIONAL
	2015
卷号	41期号:[db:dc_citation_issue]页码:S289-S295
关键词	Electronic properties Thin films Sol-gel processes
ISSN号	0272-8842
DOI	[db:dc_identifier_doi]
URL标识	查看原文
WOS记录号	[DB:DC_IDENTIFIER_WOSID]
内容类型	期刊论文
URI标识	http://www.corc.org.cn/handle/1471x/3261069
专题	西安交通大学
推荐引用方式 GB/T 7714	Geng, Wenping,Liu, Yang,Lou, Xiaojie,et al. Polarization fatigue in antiferroelectric (Pb,La)(Zr,Ti)O-3 thin films: The role of the effective strength of driving waveform[J]. CERAMICS INTERNATIONAL,2015,41([db:dc_citation_issue]):S289-S295.
APA	Geng, Wenping.,Liu, Yang.,Lou, Xiaojie.,Zhang, Fuping.,Liu, Qida.,...&Jiang, Anquan.(2015).Polarization fatigue in antiferroelectric (Pb,La)(Zr,Ti)O-3 thin films: The role of the effective strength of driving waveform.CERAMICS INTERNATIONAL,41([db:dc_citation_issue]),S289-S295.
MLA	Geng, Wenping,et al."Polarization fatigue in antiferroelectric (Pb,La)(Zr,Ti)O-3 thin films: The role of the effective strength of driving waveform".CERAMICS INTERNATIONAL 41.[db:dc_citation_issue](2015):S289-S295.

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