| Influence of Voltage Polarity on Breakdown of SF6 Rod-plate Gap Under VFTO and Standard LI | |
| Wen, Tao; Zhang, Qiaogen; Qin, Yifan; Tao, Fengbo; Jia, Yongyong; Tan, Xiangyu; You, Haoyang; Wang, Tonglei | |
| 2015 | |
| 关键词 | standard lightning impulse 50 very fast transient overvoltage breakdown voltage SF6 rod-plate gap voltage polarity |
| 期号 | [db:dc_citation_issue] |
| DOI | [db:dc_identifier_doi] |
| 页码 | 172-175 |
| 会议录 | 2015 IEEE 11TH INTERNATIONAL CONFERENCE ON THE PROPERTIES AND APPLICATIONS OF DIELECTRIC MATERIALS
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| URL标识 | 查看原文 |
| ISSN号 | 9781479989034 |
| WOS记录号 | [DB:DC_IDENTIFIER_WOSID] |
| 内容类型 | 会议论文 |
| URI标识 | http://www.corc.org.cn/handle/1471x/3254095 |
| 专题 | 西安交通大学 |
| 推荐引用方式 GB/T 7714 | Wen, Tao,Zhang, Qiaogen,Qin, Yifan,et al. Influence of Voltage Polarity on Breakdown of SF6 Rod-plate Gap Under VFTO and Standard LI[C]. 见:. |
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