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	Te inclusion-induced electrical field perturbation in CdZnTe single crystals revealed by Kelvin probe force microscopy
	Gu, Yaxu; Jie, Wanqi; Li, Linglong; Xu, Yadong; Yang, Yaodong; Ren, Jie; Zha, Gangqiang; Wang, Tao; Xu, Lingyan; He, Yihui
刊名	MICRON
	2016
卷号	88期号:[db:dc_citation_issue]页码:48-53
关键词	Kelvin probe force microscopy Electrical property Bias dependent CdZnTe Te inclusion
ISSN号	0968-4328
DOI	[db:dc_identifier_doi]
URL标识	查看原文
WOS记录号	[DB:DC_IDENTIFIER_WOSID]
内容类型	期刊论文
URI标识	http://www.corc.org.cn/handle/1471x/3231623
专题	西安交通大学
推荐引用方式 GB/T 7714	Gu, Yaxu,Jie, Wanqi,Li, Linglong,et al. Te inclusion-induced electrical field perturbation in CdZnTe single crystals revealed by Kelvin probe force microscopy[J]. MICRON,2016,88([db:dc_citation_issue]):48-53.
APA	Gu, Yaxu.,Jie, Wanqi.,Li, Linglong.,Xu, Yadong.,Yang, Yaodong.,...&Xi, Shouzhi.(2016).Te inclusion-induced electrical field perturbation in CdZnTe single crystals revealed by Kelvin probe force microscopy.MICRON,88([db:dc_citation_issue]),48-53.
MLA	Gu, Yaxu,et al."Te inclusion-induced electrical field perturbation in CdZnTe single crystals revealed by Kelvin probe force microscopy".MICRON 88.[db:dc_citation_issue](2016):48-53.

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