Quantitative Trait Locus Mapping of Soybean Maturity Gene E6

	Quantitative Trait Locus Mapping of Soybean Maturity Gene E6
	X. M. Li, C. Fang, M. L. Xu, F. G. Zhang, S. J. Lu, H. Y. Nan, T. Su, S. C. Li, X. H. Zhao, L. P. Kong, X. H. Yuan, B. H. Liu, J. Abe, E. R. Cober and F. J. Kong
刊名	Crop Science
	2017
卷号	57 期号:5 页码:2547-2554
通讯作者	刘宝辉，孔凡江
中文摘要	Soybean [ Glycine max (L.) Merr.] sensitivity to photoperiod determines adaptation to a specific range of latitudes for soybean cultivars. When temperate-adapted soybean cultivars are grown in low latitude under short day conditions, they flower early, resulting in low grain yield, and consequently limiting their utility in tropical areas. Most cultivars adapted to low-latitude environments have the trait of delayed flowering under short day conditions, and this trait is commonly called long juvenile (LJ). In this study, the E6 locus, the classical locus conditioning the LJ trait, was molecularly mapped on Gm04 near single-nucleotide polymorphism marker HRM101. Testcross, genetic mapping, and sequencing suggest that the E6 and J loci might be tightly linked. Genetic interaction evaluation between E6 and E1 suggests that E6 has a suppressive effect on E1 and that the function of E6 is dependent on E1. The tagging markers for E6 are very useful for molecular breeding for wide adaptation and stable productivity of soybean under lowlatitude environments. Molecular identification and functional characterization of the E6 gene will greatly facilitate the understanding of the genetic and molecular mechanisms underlying the LJ trait.
WOS记录号	WOS:000410728900023
内容类型	期刊论文
源URL	[http://ir.iga.ac.cn/handle/131322/7577]
专题	东北地理与农业生态研究所_湿地与全球变化学科组_期刊论文
推荐引用方式 GB/T 7714	X. M. Li, C. Fang, M. L. Xu, F. G. Zhang, S. J. Lu, H. Y. Nan, T. Su, S. C. Li, X. H. Zhao, L. P. Kong, X. H. Yuan, B. H. Liu, J. Abe, E. R. Cober and F. J. Kong. Quantitative Trait Locus Mapping of Soybean Maturity Gene E6[J]. Crop Science,2017,57(5):2547-2554.
APA	X. M. Li, C. Fang, M. L. Xu, F. G. Zhang, S. J. Lu, H. Y. Nan, T. Su, S. C. Li, X. H. Zhao, L. P. Kong, X. H. Yuan, B. H. Liu, J. Abe, E. R. Cober and F. J. Kong.(2017).Quantitative Trait Locus Mapping of Soybean Maturity Gene E6.Crop Science,57(5),2547-2554.
MLA	X. M. Li, C. Fang, M. L. Xu, F. G. Zhang, S. J. Lu, H. Y. Nan, T. Su, S. C. Li, X. H. Zhao, L. P. Kong, X. H. Yuan, B. H. Liu, J. Abe, E. R. Cober and F. J. Kong."Quantitative Trait Locus Mapping of Soybean Maturity Gene E6".Crop Science 57.5(2017):2547-2554.