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	A high-performance scanning grating based on tilted (111) silicon wafer for near infrared micro spectrometer application
	Nie, Qiuyu[1,2,3]; Wen, Zhiyu[1,2]; Huang, Jian[1,2]
	2015
卷号	21页码:1749-1755
URL标识	查看原文
内容类型	期刊论文
URI标识	http://www.corc.org.cn/handle/1471x/2974232
专题	重庆大学
推荐引用方式 GB/T 7714	Nie, Qiuyu[1,2,3],Wen, Zhiyu[1,2],Huang, Jian[1,2]. A high-performance scanning grating based on tilted (111) silicon wafer for near infrared micro spectrometer application[J],2015,21:1749-1755.
APA	Nie, Qiuyu[1,2,3],Wen, Zhiyu[1,2],&Huang, Jian[1,2].(2015).A high-performance scanning grating based on tilted (111) silicon wafer for near infrared micro spectrometer application.,21,1749-1755.
MLA	Nie, Qiuyu[1,2,3],et al."A high-performance scanning grating based on tilted (111) silicon wafer for near infrared micro spectrometer application".21(2015):1749-1755.

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