| EMP susceptibility modeling and assessment of electronic system based on hierarchical Bayesian networks | |
| Liu, Yu; Han, Feng; Lu, Xi-Cheng; Wang, Jian-Guo | |
| 刊名 | Tien Tzu Hsueh Pao/Acta Electronica Sinica
 |
| 2016 | |
| 卷号 | 44页码:2695-2703 |
| 关键词 | Assessment models Electromagnetic stress Electronic systems Hierarchical Bayesian networks Hierarchical structures System susceptibility Topology relationships Vulnerability |
| ISSN号 | 0372-2112 |
| URL标识 | 查看原文 |
| 内容类型 | 期刊论文 |
| URI标识 | http://www.corc.org.cn/handle/1471x/2963711 |
| 专题 | 西安交通大学 |
| 推荐引用方式 GB/T 7714 | Liu, Yu,Han, Feng,Lu, Xi-Cheng,et al. EMP susceptibility modeling and assessment of electronic system based on hierarchical Bayesian networks[J]. Tien Tzu Hsueh Pao/Acta Electronica Sinica,2016,44:2695-2703. |
| APA | Liu, Yu,Han, Feng,Lu, Xi-Cheng,&Wang, Jian-Guo.(2016).EMP susceptibility modeling and assessment of electronic system based on hierarchical Bayesian networks.Tien Tzu Hsueh Pao/Acta Electronica Sinica,44,2695-2703. |
| MLA | Liu, Yu,et al."EMP susceptibility modeling and assessment of electronic system based on hierarchical Bayesian networks".Tien Tzu Hsueh Pao/Acta Electronica Sinica 44(2016):2695-2703. |
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