| Total-Dose Radiation Response and and Post-Irradiation Annealing Response of Hafnium Capacitors | |
| Liu, Xin; Lei, Yuqiu; Cheng, Yonghong | |
| 2016 | |
| 关键词 | HfO2 post-irradiation annealing radiation effect MOS capacity |
| 会议录 | 2016 JOINT IEEE INTERNATIONAL SYMPOSIUM ON THE APPLICATIONS OF FERROELECTRICS, EUROPEAN CONFERENCE ON APPLICATION OF POLAR DIELECTRICS, AND PIEZOELECTRIC FORCE MICROSCOPY WORKSHOP (ISAF/ECAPD/PFM)
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| URL标识 | 查看原文 |
| ISSN号 | 9781509018710 |
| 内容类型 | 会议论文 |
| URI标识 | http://www.corc.org.cn/handle/1471x/2951828 |
| 专题 | 西安交通大学 |
| 推荐引用方式 GB/T 7714 | Liu, Xin,Lei, Yuqiu,Cheng, Yonghong. Total-Dose Radiation Response and and Post-Irradiation Annealing Response of Hafnium Capacitors[C]. 见:. |
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