Simulation of Internal Electric Field of High-voltage Metal-enclosed Switchgear and Influencing Factors | |
Jia, Yongyong; Yang, Jinggang; Gao, Shan; Tao, Fengbo; Zou, Hai; Zhang, Guogang | |
刊名 | Gaoya Dianqi/High Voltage Apparatus |
2017 | |
卷号 | 53 |
关键词 | Electric field analysis Finite element method High-voltage metal-enclosed switchgear Optimization |
ISSN号 | 1001-1609 |
URL标识 | 查看原文 |
内容类型 | 期刊论文 |
URI标识 | http://www.corc.org.cn/handle/1471x/2949280 |
专题 | 西安交通大学 |
推荐引用方式 GB/T 7714 | Jia, Yongyong,Yang, Jinggang,Gao, Shan,et al. Simulation of Internal Electric Field of High-voltage Metal-enclosed Switchgear and Influencing Factors[J]. Gaoya Dianqi/High Voltage Apparatus,2017,53. |
APA | Jia, Yongyong,Yang, Jinggang,Gao, Shan,Tao, Fengbo,Zou, Hai,&Zhang, Guogang.(2017).Simulation of Internal Electric Field of High-voltage Metal-enclosed Switchgear and Influencing Factors.Gaoya Dianqi/High Voltage Apparatus,53. |
MLA | Jia, Yongyong,et al."Simulation of Internal Electric Field of High-voltage Metal-enclosed Switchgear and Influencing Factors".Gaoya Dianqi/High Voltage Apparatus 53(2017). |
个性服务 |
查看访问统计 |
相关权益政策 |
暂无数据 |
收藏/分享 |
除非特别说明,本系统中所有内容都受版权保护,并保留所有权利。
修改评论