CORC  > 西安交通大学
Simulation of Internal Electric Field of High-voltage Metal-enclosed Switchgear and Influencing Factors
Jia, Yongyong; Yang, Jinggang; Gao, Shan; Tao, Fengbo; Zou, Hai; Zhang, Guogang
刊名Gaoya Dianqi/High Voltage Apparatus
2017
卷号53
关键词Electric field analysis Finite element method High-voltage metal-enclosed switchgear Optimization
ISSN号1001-1609
URL标识查看原文
内容类型期刊论文
URI标识http://www.corc.org.cn/handle/1471x/2949280
专题西安交通大学
推荐引用方式
GB/T 7714
Jia, Yongyong,Yang, Jinggang,Gao, Shan,et al. Simulation of Internal Electric Field of High-voltage Metal-enclosed Switchgear and Influencing Factors[J]. Gaoya Dianqi/High Voltage Apparatus,2017,53.
APA Jia, Yongyong,Yang, Jinggang,Gao, Shan,Tao, Fengbo,Zou, Hai,&Zhang, Guogang.(2017).Simulation of Internal Electric Field of High-voltage Metal-enclosed Switchgear and Influencing Factors.Gaoya Dianqi/High Voltage Apparatus,53.
MLA Jia, Yongyong,et al."Simulation of Internal Electric Field of High-voltage Metal-enclosed Switchgear and Influencing Factors".Gaoya Dianqi/High Voltage Apparatus 53(2017).
个性服务
查看访问统计
相关权益政策
暂无数据
收藏/分享
所有评论 (0)
暂无评论
 

除非特别说明,本系统中所有内容都受版权保护,并保留所有权利。


©版权所有 ©2017 CSpace - Powered by CSpace