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Double-gate-all-around tunnel field-effect transistor
Zhang, Wen-Hao; Li, Zun-Chao; Guan, Yun-He; Zhang, Ye-Fei
刊名CHINESE PHYSICS B
2017
卷号26
关键词tunnel field effect transistor (TFET) drain induced barrier thinning (DIBT) gate-all-around (GAA)
ISSN号1674-1056
URL标识查看原文
内容类型期刊论文
URI标识http://www.corc.org.cn/handle/1471x/2948881
专题西安交通大学
推荐引用方式
GB/T 7714
Zhang, Wen-Hao,Li, Zun-Chao,Guan, Yun-He,et al. Double-gate-all-around tunnel field-effect transistor[J]. CHINESE PHYSICS B,2017,26.
APA Zhang, Wen-Hao,Li, Zun-Chao,Guan, Yun-He,&Zhang, Ye-Fei.(2017).Double-gate-all-around tunnel field-effect transistor.CHINESE PHYSICS B,26.
MLA Zhang, Wen-Hao,et al."Double-gate-all-around tunnel field-effect transistor".CHINESE PHYSICS B 26(2017).
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