| An AST-ELM Method for Eliminating the Influence of Charging Phenomenon on ECT | |
| Wang, Xiaoxin; Hu, Hongli; Jia, Huiqin; Tang, Kaihao | |
| 刊名 | SENSORS
 |
| 2017 | |
| 卷号 | 17 |
| 关键词 | electrical capacitance tomography (ECT) charging phenomenon extreme learning machine adaptive soft-thresholding |
| ISSN号 | 1424-8220 |
| URL标识 | 查看原文 |
| 内容类型 | 期刊论文 |
| URI标识 | http://www.corc.org.cn/handle/1471x/2935838 |
| 专题 | 西安交通大学 |
| 推荐引用方式 GB/T 7714 | Wang, Xiaoxin,Hu, Hongli,Jia, Huiqin,et al. An AST-ELM Method for Eliminating the Influence of Charging Phenomenon on ECT[J]. SENSORS,2017,17. |
| APA | Wang, Xiaoxin,Hu, Hongli,Jia, Huiqin,&Tang, Kaihao.(2017).An AST-ELM Method for Eliminating the Influence of Charging Phenomenon on ECT.SENSORS,17. |
| MLA | Wang, Xiaoxin,et al."An AST-ELM Method for Eliminating the Influence of Charging Phenomenon on ECT".SENSORS 17(2017). |
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