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Modeling a Si homojunction SOI-Tunnel FET with configurable voltage difference on gates
Wei, Sufen; Zhang, Guohe; Liu, Jing; Huang, Huixiang; Geng, Li; Shao, Zhibiao; Yang, Cheng-Fu
2017
关键词Band to band tunneling Channel region N type silicon Potential barriers Silicon on insulator (SOI) Technology computer aided design Tunnel FET (TFET) Voltage difference
页码1297-1299
会议录Proceedings of the 2017 IEEE International Conference on Applied System Innovation: Applied System Innovation for Modern Technology, ICASI 2017
URL标识查看原文
ISSN号9781509048977
内容类型会议论文
URI标识http://www.corc.org.cn/handle/1471x/2924284
专题西安交通大学
推荐引用方式
GB/T 7714
Wei, Sufen,Zhang, Guohe,Liu, Jing,et al. Modeling a Si homojunction SOI-Tunnel FET with configurable voltage difference on gates[C]. 见:.
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