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	Exploiting the categorical reliability difference for binary classification
	Sun, Lei; Toh, Kar-Ann; Chen, Badong; Lin, Zhiping
刊名	JOURNAL OF THE FRANKLIN INSTITUTE-ENGINEERING AND APPLIED MATHEMATICS
	2018
卷号	355页码:2022-2040
ISSN号	0016-0032
URL标识	查看原文
内容类型	期刊论文
URI标识	http://www.corc.org.cn/handle/1471x/2922203
专题	西安交通大学
推荐引用方式 GB/T 7714	Sun, Lei,Toh, Kar-Ann,Chen, Badong,et al. Exploiting the categorical reliability difference for binary classification[J]. JOURNAL OF THE FRANKLIN INSTITUTE-ENGINEERING AND APPLIED MATHEMATICS,2018,355:2022-2040.
APA	Sun, Lei,Toh, Kar-Ann,Chen, Badong,&Lin, Zhiping.(2018).Exploiting the categorical reliability difference for binary classification.JOURNAL OF THE FRANKLIN INSTITUTE-ENGINEERING AND APPLIED MATHEMATICS,355,2022-2040.
MLA	Sun, Lei,et al."Exploiting the categorical reliability difference for binary classification".JOURNAL OF THE FRANKLIN INSTITUTE-ENGINEERING AND APPLIED MATHEMATICS 355(2018):2022-2040.

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