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	Real-time monitoring of 2D semiconductor film growth with optical spectroscopy.
	Wei, Y.a; Shen, W.a,b; Roth, D.b; Wu, S.a; Hu, C.a; Li, Y.a; Hu, X.a; Hohage, M.b; Bauer, P.b; Sun, L.b
刊名	Nanotechnology
	2017
卷号	Vol.28 No.46页码:465601
URL标识	查看原文
内容类型	期刊论文
URI标识	http://www.corc.org.cn/handle/1471x/2894013
专题	天津大学
作者单位	1.aState Key Laboratory of Precision Measuring Technology and Instruments, Tianjin University, Weijin Road 92, Tianjin, 300072, China 2.bInstitute of Experimental Physics, Johannes Kepler University Linz, Linz, A-4040, Austria
推荐引用方式 GB/T 7714	Wei, Y.a,Shen, W.a,b,Roth, D.b,et al. Real-time monitoring of 2D semiconductor film growth with optical spectroscopy.[J]. Nanotechnology,2017,Vol.28 No.46:465601.
APA	Wei, Y.a.,Shen, W.a,b.,Roth, D.b.,Wu, S.a.,Hu, C.a.,...&Sun, L.b.(2017).Real-time monitoring of 2D semiconductor film growth with optical spectroscopy..Nanotechnology,Vol.28 No.46,465601.
MLA	Wei, Y.a,et al."Real-time monitoring of 2D semiconductor film growth with optical spectroscopy.".Nanotechnology Vol.28 No.46(2017):465601.

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