| A Study of High-Low Frequency Charge Pumping Method on Evaluating Interface Traps in Bulk FinFETs | |
| Ying Jin; Yangyu Tian; Kun Chen; Jun Luo | |
| 刊名 | ECS Journal of Solid State Science and Technology
 |
| 2018-01-24 | |
| 文献子类 | 期刊论文 |
| 内容类型 | 期刊论文 |
| 源URL | [http://159.226.55.107/handle/172511/19185]  |
| 专题 | 微电子研究所_集成电路先导工艺研发中心 |
| 推荐引用方式 GB/T 7714 | Ying Jin,Yangyu Tian,Kun Chen,et al. A Study of High-Low Frequency Charge Pumping Method on Evaluating Interface Traps in Bulk FinFETs[J]. ECS Journal of Solid State Science and Technology,2018. |
| APA | Ying Jin,Yangyu Tian,Kun Chen,&Jun Luo.(2018).A Study of High-Low Frequency Charge Pumping Method on Evaluating Interface Traps in Bulk FinFETs.ECS Journal of Solid State Science and Technology. |
| MLA | Ying Jin,et al."A Study of High-Low Frequency Charge Pumping Method on Evaluating Interface Traps in Bulk FinFETs".ECS Journal of Solid State Science and Technology (2018). |
| 个性服务 |
| 查看访问统计 |
| 相关权益政策 |
| 暂无数据 |
| 收藏/分享 |
除非特别说明，本系统中所有内容都受版权保护，并保留所有权利。
修改评论