| The Impacts of Heavy Ion Energy on Single Event Upsets in SOI SRAMs | |
| Song Gu; Jie Liu; Jinshun Bi; Fazhan Zhao; zhangang Zhang; Kai Xi; Kai Peng; Yingjun Zhang | |
| 刊名 | IEEE TRANSACTIONS ON NUCLEAR SCIENCE
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| 2018-05-05 | |
| 文献子类 | 期刊论文 |
| 内容类型 | 期刊论文 |
| 源URL | [http://159.226.55.107/handle/172511/18950]  |
| 专题 | 微电子研究所_微电子器件与集成技术重点实验室 |
| 推荐引用方式 GB/T 7714 | Song Gu,Jie Liu,Jinshun Bi,et al. The Impacts of Heavy Ion Energy on Single Event Upsets in SOI SRAMs[J]. IEEE TRANSACTIONS ON NUCLEAR SCIENCE,2018. |
| APA | Song Gu.,Jie Liu.,Jinshun Bi.,Fazhan Zhao.,zhangang Zhang.,...&Yingjun Zhang.(2018).The Impacts of Heavy Ion Energy on Single Event Upsets in SOI SRAMs.IEEE TRANSACTIONS ON NUCLEAR SCIENCE. |
| MLA | Song Gu,et al."The Impacts of Heavy Ion Energy on Single Event Upsets in SOI SRAMs".IEEE TRANSACTIONS ON NUCLEAR SCIENCE (2018). |
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