Cluster Restoration-Based Trace Signal Selection for Post-Silicon Debug

doi:10.1109/TCAD.2018.2818690

CORC > 计算技术研究所 > 中国科学院计算技术研究所 > 中国科学院计算技术研究所期刊论文 > 英文

	Cluster Restoration-Based Trace Signal Selection for Post-Silicon Debug
	Wang, Ying 1,2; Cheng, Yun 1,2; Li, Huawei 1,2; Li, Xiaowei 1,2
刊名	IEEE TRANSACTIONS ON COMPUTER-AIDED DESIGN OF INTEGRATED CIRCUITS AND SYSTEMS
	2019-04-01
卷号	38 期号:4 页码:767-779
关键词	Cluster generation post-silicon debug state restoration trace signal selection
ISSN号	0278-0070
DOI	10.1109/TCAD.2018.2818690
英文摘要	Trace signal selection is of great importance for post-silicon debug. Debuggers traditionally use state restoration to improve the observability of the trace data, and state restoration ratio (SRR) is computed after state restoration. In this paper, we exploit the combination of snapshot states and trace states to improve the observability. First, we propose a novel state restoration method, called cluster restoration. It uses both the snapshot states of flip-flop clusters at the beginning of tracing, and the tracing states of the clusters' inputs during the tracing window to deterministically restore all states of these clusters during the tracing window. We also present a cluster restoration-based trace signal selection method to select clusters instead of trace signals directly, which includes two stages: 1) cluster generation and 2) cluster evaluation. For cluster generation, feedback loop-based cluster generation and backward tracing-based cluster generation techniques are proposed. For cluster evaluation, a new metric, called the global state restoration improvement is proposed to evaluate the candidate clusters. The experimental results show that in comparison to prior trace signal selection methods, our method can improve the SRR and reduce the runtime of trace signal selection as well.
资助项目	National Natural Science Foundation of China[61432017] ; National Natural Science Foundation of China[61532017] ; National Natural Science Foundation of China[61504153] ; National Natural Science Foundation of China[61521092] ; National Key Research and Development Program of China[2016YFF0203500] ; IEEE VLSI Test Symposium
WOS研究方向	Computer Science ; Engineering
语种	英语
出版者	IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC
WOS记录号	WOS:000462370000015
内容类型	期刊论文
源URL	[http://119.78.100.204/handle/2XEOYT63/4161]
专题	中国科学院计算技术研究所期刊论文_英文
通讯作者	Li, Huawei
作者单位	1.Univ Chinese Acad Sci, Beijing 100190, Peoples R China 2.Chinese Acad Sci, Inst Comp Technol, State Key Lab Comp Architecture, Beijing 100190, Peoples R China
推荐引用方式 GB/T 7714	Wang, Ying,Cheng, Yun,Li, Huawei,et al. Cluster Restoration-Based Trace Signal Selection for Post-Silicon Debug[J]. IEEE TRANSACTIONS ON COMPUTER-AIDED DESIGN OF INTEGRATED CIRCUITS AND SYSTEMS,2019,38(4):767-779.
APA	Wang, Ying,Cheng, Yun,Li, Huawei,&Li, Xiaowei.(2019).Cluster Restoration-Based Trace Signal Selection for Post-Silicon Debug.IEEE TRANSACTIONS ON COMPUTER-AIDED DESIGN OF INTEGRATED CIRCUITS AND SYSTEMS,38(4),767-779.
MLA	Wang, Ying,et al."Cluster Restoration-Based Trace Signal Selection for Post-Silicon Debug".IEEE TRANSACTIONS ON COMPUTER-AIDED DESIGN OF INTEGRATED CIRCUITS AND SYSTEMS 38.4(2019):767-779.