An ion current intensity measurement device in visible light emission measurements of the interaction of slow, highly charged ion with solid surfaces

doi:10.1088/1742-6596/488/14/142012

	An ion current intensity measurement device in visible light emission measurements of the interaction of slow, highly charged ion with solid surfaces
	Zhao, Hong-yun; Xu, Qiu-mei; Guo, Yi-pan; Kong, Jie; Qian, Yi; Yang, Zhi-hu; IOP; Su, Hong
	2014
卷号	488
DOI	10.1088/1742-6596/488/14/142012
英文摘要	In order to solve the problem of influence on measured spectrum caused by the ion current with unstable current intensity, we developed a set of device which can acquire and save the data of ion current intensities in real time during experiment. By means of off-line normalizing th saved data by PC, the influence will be eliminated efficiently.
会议录	XXVIII INTERNATIONAL CONFERENCE ON PHOTONIC, ELECTRONIC AND ATOMIC COLLISIONS (ICPEAC)
会议录出版者	IOP PUBLISHING LTD
会议录出版地	DIRAC HOUSE, TEMPLE BACK, BRISTOL BS1 6BE, ENGLAND
语种	英语
WOS研究方向	Physics
WOS记录号	WOS:000338432500380
内容类型	会议论文
源URL	[http://119.78.100.186/handle/113462/58535]
专题	近代物理研究所_实验物理中心
通讯作者	Zhao, Hong-yun
作者单位	Chinese Acad Sci, Inst Modern Phys, Lanzhou 730000, Gansu, Peoples R China
推荐引用方式 GB/T 7714	Zhao, Hong-yun,Xu, Qiu-mei,Guo, Yi-pan,et al. An ion current intensity measurement device in visible light emission measurements of the interaction of slow, highly charged ion with solid surfaces[C]. 见:.