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	The response of electrostatic MEMS structure under mechanical shock and electrostatic forces
	Li, Xiang Guang ; Huang, Qin Wen ; Wang, Yun Hui ; Jia, Yu Bin ; Wang, Zhi Bin
	2013
英文摘要	For MEMS devices actuated by electrostatic force, unexpected failure modes can be hardly predicted when the electrostatic force coupled with the shock. A response model is established when a micro cantilever subjected to electrostatic force and mechanical shock. First, based on the theory of transverse forced vibration in vibration mechanics, the equation of motion under shock and electrostatic fore is presented. Then the reduced order model is gained after simplifying by mode superposition method. The computing results indicate that: the shock amplitude and duration are the key factors to affect the reliability of the device; the shock load and electrostatic forces make the threshold voltage much lower than the anticipated value. The micro cantilever may collapse to the substrate even at a voltage far lower than the pull-in voltage. This early dynamic pull-in instability may cause some failures such as short circuit, adhesion or collision damage. ? (2013) Trans Tech Publications, Switzerland.; EI; 0
语种	英语
DOI标识	10.4028/www.scientific.net/AMM.427-429.120
内容类型	其他
源URL	[http://ir.pku.edu.cn/handle/20.500.11897/411657]
专题	信息科学技术学院
推荐引用方式 GB/T 7714	Li, Xiang Guang,Huang, Qin Wen,Wang, Yun Hui,et al. The response of electrostatic MEMS structure under mechanical shock and electrostatic forces. 2013-01-01.

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