QQ客服 官方微博 反馈留言

	A TDC based process variation sensor for both NMOS and PMOS variation monitoration
	Ai, Lei ; He, Yandong ; Zhang, Ganggang ; Zhang, Xing
	2014
英文摘要	A TDC based process variation sensing circuit for monitoring the variation of both NMOS and PMOS is proposed. The digital outputs of this sensor can offer the circuit designer clear message that indicates the variation of both NMOS and PMOS. Based on the specific inverter chain design concept, this sensor demonstrated with better sensitivity. 10000 Monte Carlo Simulation based on 65nm bulk CMOS process technology is used to verify the feasibility of this sensor. ? 2014 IEEE.; EI; 0
语种	英语
DOI标识	10.1109/EDSSC.2014.7061185
内容类型	其他
源URL	[http://ir.pku.edu.cn/handle/20.500.11897/294793]
专题	信息科学技术学院
推荐引用方式 GB/T 7714	Ai, Lei,He, Yandong,Zhang, Ganggang,et al. A TDC based process variation sensor for both NMOS and PMOS variation monitoration. 2014-01-01.

个性服务

查看访问统计

相关权益政策

暂无数据

收藏/分享

除非特别说明，本系统中所有内容都受版权保护，并保留所有权利。