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	Lateral bipolar transistor on SOI with dual-sidewalls structure
	Cai, Y ; Zhang, LC
	2001
关键词	bipolar SOI lateral dual-sidewalls high-performance
英文摘要	In this paper, a novel lateral bipolar transistor on silicon on insulator material is proposed. Dual-sidewalls technology, which is used in some vertical bipolar devices, is applied in this transistor. The first poly-Si sidewall decreases parasitic Cbc capacitor to the lowest level. The second insulator sidewall is used to separate high concentration emitter from base. Different side-wall width will result in different width of intrinsic base. That means thin intrinsic base could be easily achieved by adjusting insulator sidewall. There are other key technologies also, such as: angled implantation, self-aligned silicide. Results of processes simulation show that all the processes are available, the expected structure and profiles are controllable. Device simulation gives an excellent performance: f(T) is over 30GHz, DC current gain is over 20. This type of lateral bipolar transistor with high performances should be a potential competitor in RF devices & ICs, and should meet the needs of SOI-BiCMOS ICs.; http://gateway.webofknowledge.com/gateway/Gateway.cgi?GWVersion=2&SrcApp=PARTNER_APP&SrcAuth=LinksAMR&KeyUT=WOS:000174067300029&DestLinkType=FullRecord&DestApp=ALL_WOS&UsrCustomerID=8e1609b174ce4e31116a60747a720701 ; Engineering, Electrical & Electronic; Optics; EI; CPCI-S(ISTP); 0
语种	英语
DOI标识	10.1117/12.444678
内容类型	其他
源URL	[http://ir.pku.edu.cn/handle/20.500.11897/293935]
专题	信息科学技术学院
推荐引用方式 GB/T 7714	Cai, Y,Zhang, LC. Lateral bipolar transistor on SOI with dual-sidewalls structure. 2001-01-01.

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