SiN-masked GaN-on-Patterned-Silicon (GPS) technique for fabrication of suspended GaN microstructures | |
Yang, Zhenchuan ; Zhang, Baoshun ; Lau, Kei May ; Chen, Kevin J. | |
2007 | |
英文摘要 | We developed a SiN-masked GaN-on-Patterned-Silicon (GPS) technique for fabricating suspended GaN microstructures without direct GaN etching. The masked GPS technique combines masked selective area growth (SAG) of gallium nitride (GaN) on patterned silicon substrate and subsequent sacrificial undercutting of GaN microstructures by isotropic wet etchant. The experimental results show that the suspended GaN microstructures fabricated by SiN-masked GPS technique can feature smooth edges. ? 2006 IEEE.; EI; 0 |
语种 | 英语 |
DOI标识 | 10.1109/ICSICT.2006.306432 |
内容类型 | 其他 |
源URL | [http://ir.pku.edu.cn/handle/20.500.11897/153705] |
专题 | 信息科学技术学院 |
推荐引用方式 GB/T 7714 | Yang, Zhenchuan,Zhang, Baoshun,Lau, Kei May,et al. SiN-masked GaN-on-Patterned-Silicon (GPS) technique for fabrication of suspended GaN microstructures. 2007-01-01. |
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