Penetrative imaging of sub-surface microstructures with a near-field   microwave microscope

doi:10.1063/1.4891215

CORC > 北京大学 > 信息科学技术学院

	Penetrative imaging of sub-surface microstructures with a near-field microwave microscope
	Sun, Weiqiang ; Yang, Yong ; Wu, Zhe ; Feng, Tao ; Zhuang, Qianwei ; Peng, Lian-Mao ; Xu, Shengyong ; Ong, Chong Kim
刊名	应用物理杂志
	2014
关键词	RESOLUTION
DOI	10.1063/1.4891215
英文摘要	Microwaves have the capability of penetrating through materials with low permittivity. By means of a near-field scanning microwave microscope system, we obtained two-dimensional maps of the incident microwave's reflection coefficient intensity and frequency shift, which correspond well to the spatial distribution and electrical conductance of fluids and metallic thin film structures hidden underneath 15-170 mu m thick dielectric covers. The lateral resolution and sensitivity to conductivity for the target samples were found closely related to the thickness of the cover layer. The technique offers a real-time, in-situ, and a non-invasive approach to monitor the local chemical reactions, the motion of fluids, and the distribution or concentrations of ions or bio-materials in lab-on-a-chip systems. This technique also has the potential to be developed for the detection of live cells and tissues. (C) 2014 AIP Publishing LLC.; Physics, Applied; SCI(E); EI; 1; ARTICLE; xusy@pku.edu.cn; phyongck@nus.edu.sg; 4; 116
语种	英语
内容类型	期刊论文
源URL	[http://ir.pku.edu.cn/handle/20.500.11897/152063]
专题	信息科学技术学院
推荐引用方式 GB/T 7714	Sun, Weiqiang,Yang, Yong,Wu, Zhe,et al. Penetrative imaging of sub-surface microstructures with a near-field microwave microscope[J]. 应用物理杂志,2014.
APA	Sun, Weiqiang.,Yang, Yong.,Wu, Zhe.,Feng, Tao.,Zhuang, Qianwei.,...&Ong, Chong Kim.(2014).Penetrative imaging of sub-surface microstructures with a near-field microwave microscope.应用物理杂志.
MLA	Sun, Weiqiang,et al."Penetrative imaging of sub-surface microstructures with a near-field microwave microscope".应用物理杂志 (2014).