Ultraviolet Bidirectional reflectance distribution functionn measurement and analysis of typical roughness surface

	Ultraviolet Bidirectional reflectance distribution functionn measurement and analysis of typical roughness surface
	Bai Lu ; Zhang Han-lu ; Cao Yun-hua ; Li Hai-ying ; Wu Zhen-sen ; Wang Shi-mei
	2010
会议名称	optical metrology and inspection for industrial applications
会议日期	2010-10-18
会议地点	beijing,china
会议录	proc. of spie vol. 7855 78551j-1
学科主题	环境光学监测技术
内容类型	会议论文
源URL	[http://ir.hfcas.ac.cn/handle/334002/4509]
专题	合肥物质科学研究院_中科院安徽光学精密机械研究所
推荐引用方式 GB/T 7714	Bai Lu,Zhang Han-lu,Cao Yun-hua,et al. Ultraviolet Bidirectional reflectance distribution functionn measurement and analysis of typical roughness surface[C]. 见:optical metrology and inspection for industrial applications. beijing,china. 2010-10-18.