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Structure Characterization by 3D ED and PXRD; Structure Characterization by 3D ED and PXRD
Junliang Sun
2016
关键词challenging mature enough synthesize defects overlapping crystalline dimensions Electron sizes challenging mature enough synthesize defects overlapping crystalline dimensions Electron sizes
英文摘要Structure determination of nano-size crystals or crystals with defects is always a challenging problem.For quite lots of materials,it is very difficult to synthesize large/good enough crystals for single crystal X-ray diffraction studies.Powder X-ray diffraction(PXRD)is the major method for their atomic structure determination,PXRD is a quite mature technique and lots of powder; Structure determination of nano-size crystals or crystals with defects is always a challenging problem.For quite lots of materials,it is very difficult to synthesize large/good enough crystals for single crystal X-ray diffraction studies.Powder X-ray diffraction(PXRD)is the major method for their atomic structure determination,PXRD is a quite mature technique and lots of powder; 中国晶体学会; 1
语种英语
出处中国晶体学会第六届学术年会暨会员代表大会——多晶(粉晶)衍射分会
内容类型其他
源URL[http://ir.pku.edu.cn/handle/20.500.11897/479695]  
专题化学与分子工程学院
推荐引用方式
GB/T 7714
Junliang Sun. Structure Characterization by 3D ED and PXRD, Structure Characterization by 3D ED and PXRD. 2016-01-01.
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