Development of growth and thermal stresses in NiO scale on pure Ni: The metal nanocrystallization effect

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	Development of growth and thermal stresses in NiO scale on pure Ni: The metal nanocrystallization effect
	Wei, X.; Peng, X.; Wang, X.; Dong, Z.; Peng, X (reprint author), Nanchang Hongkong Univ, Sch Mat Sci & Engn, 696 Fenghenan Ave, Nanchang 330063, Jiangxi, Peoples R China.
刊名	PERGAMON-ELSEVIER SCIENCE LTD
	2017-12-01
卷号	129 页码:226-236
关键词	Nickel Sem Tem Oxidation Electrodeposited Films Effects Of Strain
ISSN号	0010-938X
英文摘要	Ni sheet samples with one side normally coarse-grained and the other side nano-grained have been prepared for two-sided oxidation deflection testing. The sample is sharply deflected during heating up to 800 degrees C in air, because of a significant nano-grain growth. Deflection also occurs during the subsequent isothermal oxidation and cooling, due to the difference in the development of the growth and thermal stresses in the thermally-grown NiO on the nanocrystalline Ni. The latter is interpreted based on the investigation of the Ni nanocrystallization effect on the evolution of the microstructure of the NiO scale with time.; Ni sheet samples with one side normally coarse-grained and the other side nano-grained have been prepared for two-sided oxidation deflection testing. The sample is sharply deflected during heating up to 800 degrees C in air, because of a significant nano-grain growth. Deflection also occurs during the subsequent isothermal oxidation and cooling, due to the difference in the development of the growth and thermal stresses in the thermally-grown NiO on the nanocrystalline Ni. The latter is interpreted based on the investigation of the Ni nanocrystallization effect on the evolution of the microstructure of the NiO scale with time.
学科主题	Materials Science, Multidisciplinary ; Metallurgy & Metallurgical Engineering
语种	英语
资助机构	National Natural Science Foundation of China (NSFC) [51271189]
公开日期	2018-01-10
内容类型	期刊论文
源URL	[http://ir.imr.ac.cn/handle/321006/78952]
专题	金属研究所_中国科学院金属研究所
通讯作者	Peng, X (reprint author), Nanchang Hongkong Univ, Sch Mat Sci & Engn, 696 Fenghenan Ave, Nanchang 330063, Jiangxi, Peoples R China.
推荐引用方式 GB/T 7714	Wei, X.,Peng, X.,Wang, X.,et al. Development of growth and thermal stresses in NiO scale on pure Ni: The metal nanocrystallization effect[J]. PERGAMON-ELSEVIER SCIENCE LTD,2017,129:226-236.
APA	Wei, X.,Peng, X.,Wang, X.,Dong, Z.,&Peng, X .(2017).Development of growth and thermal stresses in NiO scale on pure Ni: The metal nanocrystallization effect.PERGAMON-ELSEVIER SCIENCE LTD,129,226-236.
MLA	Wei, X.,et al."Development of growth and thermal stresses in NiO scale on pure Ni: The metal nanocrystallization effect".PERGAMON-ELSEVIER SCIENCE LTD 129(2017):226-236.