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	Effects of annealing treatment on the microstructure evolution and the strength degradation behavior of the commercially pure Al conductor
	Hou, J. P.; Chen, Q. Y.; Wang, Q.; Yu, H. Y.; Zhang, Z. J.; Li, R.; Li, X. W.; Zhang, Z. F.; Wang, Q; Zhang, ZF (reprint author), Chinese Acad Sci, Inst Met Res, Shenyang Natl Lab Mat Sci, 72 Wenhua Rd, Shenyang 110016, Liaoning, Peoples R China.
刊名	ELSEVIER SCIENCE SA
	2017-11-07
卷号	707页码:511-517
关键词	CommerciAlly Pure Al Conductor Strength Annealing Treatment Texture Evolution
ISSN号	0921-5093
英文摘要	Strength degradation during the electron transmission process is always a hidden danger to the overhead transmission lines. In this study, the microstructure evolutions and the strength degradation behaviors of a cold drawn commercially pure Al conductor (CPAC) were investigated systematically by a series of annealing experiments. The results show that the texture evolution, dislocation recovery and subgrain growth during the recrystallization should be responsible for the strength degradation of CPAC. Besides, the microstructure evolution depends on the annealing temperature. For instance, some of the < 111 > texture was changed into the < 001 > one in the CPACs annealed at a temperature of 90 degrees C; while, there is an obvious increase in the subgrain width when the CPACs were annealed in the high temperature range from 150 degrees C to 300 degrees C. Finally, the strength degradation due to the texture evolution and the subgrain coarsening was quantitatively calculated based on the crystallographic analysis.; Strength degradation during the electron transmission process is always a hidden danger to the overhead transmission lines. In this study, the microstructure evolutions and the strength degradation behaviors of a cold drawn commercially pure Al conductor (CPAC) were investigated systematically by a series of annealing experiments. The results show that the texture evolution, dislocation recovery and subgrain growth during the recrystallization should be responsible for the strength degradation of CPAC. Besides, the microstructure evolution depends on the annealing temperature. For instance, some of the < 111 > texture was changed into the < 001 > one in the CPACs annealed at a temperature of 90 degrees C; while, there is an obvious increase in the subgrain width when the CPACs were annealed in the high temperature range from 150 degrees C to 300 degrees C. Finally, the strength degradation due to the texture evolution and the subgrain coarsening was quantitatively calculated based on the crystallographic analysis.
学科主题	Nanoscience & Nanotechnology ; Materials Science, Multidisciplinary ; Metallurgy & Metallurgical Engineering
语种	英语
资助机构	State Grid Corporation of China [52110416001z]; National Natural Science Foundation of China (NSFC) [51331007]
公开日期	2018-01-10
内容类型	期刊论文
源URL	[http://ir.imr.ac.cn/handle/321006/78985]
专题	金属研究所_中国科学院金属研究所
通讯作者	Wang, Q; Zhang, ZF (reprint author), Chinese Acad Sci, Inst Met Res, Shenyang Natl Lab Mat Sci, 72 Wenhua Rd, Shenyang 110016, Liaoning, Peoples R China.
推荐引用方式 GB/T 7714	Hou, J. P.,Chen, Q. Y.,Wang, Q.,et al. Effects of annealing treatment on the microstructure evolution and the strength degradation behavior of the commercially pure Al conductor[J]. ELSEVIER SCIENCE SA,2017,707:511-517.
APA	Hou, J. P..,Chen, Q. Y..,Wang, Q..,Yu, H. Y..,Zhang, Z. J..,...&Zhang, ZF .(2017).Effects of annealing treatment on the microstructure evolution and the strength degradation behavior of the commercially pure Al conductor.ELSEVIER SCIENCE SA,707,511-517.
MLA	Hou, J. P.,et al."Effects of annealing treatment on the microstructure evolution and the strength degradation behavior of the commercially pure Al conductor".ELSEVIER SCIENCE SA 707(2017):511-517.

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