Measurement of Radial Elasticity and Original Height of DNA Duplex Using Tapping-Mode Atomic Force Microscopy

CORC > 沈阳自动化研究所 > 中国科学院沈阳自动化研究所 > 机器人学研究室

	Measurement of Radial Elasticity and Original Height of DNA Duplex Using Tapping-Mode Atomic Force Microscopy
	Lang, Qian ; Wang, Hongfei ; Zhang, Xu ; Li LH(李龙海); Liu LQ(刘连庆); Chen HT(陈海涛)
刊名	NANOMATERIALS
	2019
卷号	9 期号:4 页码:1-10
关键词	DNA duplex Young's modulus AFM tapping mode
ISSN号	2079-4991
产权排序	1
英文摘要	Atomic force microscopy (AFM) can characterize nanomaterial elasticity. However, some one-dimensional nanomaterials, such as DNA, are too small to locate with an AFM tip because of thermal drift and the nonlinearity of piezoelectric actuators. In this study, we propose a novel approach to address the shortcomings of AFM and obtain the radial Young's modulus of a DNA duplex. The elastic properties are evaluated by combining physical calculations and measured experimental results. The initial elasticity of the DNA is first assumed; based on tapping-mode scanning images and tip-sample interaction force simulations, the calculated elastic modulus is extracted. By minimizing the error between the assumed and experimental values, the extracted elasticity is assigned as the actual modulus for the material. Furthermore, tapping-mode image scanning avoids the necessity of locating the probe exactly on the target sample. In addition to elasticity measurements, the deformation caused by the tapping force from the AFM tip is compensated and the original height of the DNA is calculated. The results show that the radial compressive Young's modulus of DNA is 125-150 MPa under a tapping force of 0.5-1.3 nN; its original height is 1.9 nm. This approach can be applied to the measurement of other nanomaterials.
资助项目	National Natural Science Foundation of China[31701311] ; University Nursing Program for Young Scholars with Creative Talents in Heilongjiang Province[UNPYSCT-2017016] ; China Postdoctoral Science Foundation[2017M621234]
WOS关键词	PROBE
WOS研究方向	Science & Technology - Other Topics ; Materials Science
语种	英语
WOS记录号	WOS:000467768800077
资助机构	National Natural Science Foundation of China ; University Nursing Program for Young Scholars with Creative Talents in Heilongjiang Province ; China Postdoctoral Science Foundation
内容类型	期刊论文
源URL	[http://ir.sia.cn/handle/173321/24731]
专题	沈阳自动化研究所_机器人学研究室
通讯作者	Liu LQ(刘连庆); Chen HT(陈海涛)
作者单位	1.State Key Laboratory of Robotics, Shenyang Institute of Automation, Chinese Academy of Sciences, Shenyang 110016, China 2.College of Engineering, Northeast Agricultural University, Harbin 150030, China
推荐引用方式 GB/T 7714	Lang, Qian,Wang, Hongfei,Zhang, Xu,et al. Measurement of Radial Elasticity and Original Height of DNA Duplex Using Tapping-Mode Atomic Force Microscopy[J]. NANOMATERIALS,2019,9(4):1-10.
APA	Lang, Qian,Wang, Hongfei,Zhang, Xu,Li LH,Liu LQ,&Chen HT.(2019).Measurement of Radial Elasticity and Original Height of DNA Duplex Using Tapping-Mode Atomic Force Microscopy.NANOMATERIALS,9(4),1-10.
MLA	Lang, Qian,et al."Measurement of Radial Elasticity and Original Height of DNA Duplex Using Tapping-Mode Atomic Force Microscopy".NANOMATERIALS 9.4(2019):1-10.