Spatially Resolved X-ray Photoemission Electron Microscopy of Weyl Semimetal NbAs

doi:10.1021/acs.cgd.8b00653

	Spatially Resolved X-ray Photoemission Electron Microscopy of Weyl Semimetal NbAs
	Zhang, Guanhua 3; Liu, Hongwen 2; Richard, Pierre 1,2,4,5; Zhao, Lingxiao 2; Chen, Gen-Fu 2,4,5; Ding, Hong 2,4,5
刊名	CRYSTAL GROWTH & DESIGN
	2018-09-01
卷号	18 期号:9 页码:5210-5213
ISSN号	1528-7483
DOI	10.1021/acs.cgd.8b00653
通讯作者	Liu, Hongwen(hliu@iphy.ac.cn) ; Ding, Hong(dingh@iphy.ac.cn)
英文摘要	We utilized X-ray photoemission electron microscopy (XPEEM) and X-ray photoelectron spectroscopy (XPS) to investigate the crystal surface of Weyl semimetal NbAs. XPEEM images present white and black contrast in both the Nb 3d and As 3d core level spectra. Surface-sensitive XPS spectra indicate that the entire surface of the sample contains both surface states of Nb 3d and As 3d, in the form of oxides, and bulk states of NbAs. Estimated atomic percentage values n(Nb)/n(As) suggest that the surface is Nb-rich and different for white and black areas.
资助项目	NSFC of China[11674371] ; NSFC of China[21403222] ; Canada First Research Excellence Fund
WOS关键词	FERMI ARCS ; DISCOVERY ; NODES ; TAAS
WOS研究方向	Chemistry ; Crystallography ; Materials Science
语种	英语
出版者	AMER CHEMICAL SOC
WOS记录号	WOS:000444218400051
资助机构	NSFC of China ; NSFC of China ; Canada First Research Excellence Fund ; Canada First Research Excellence Fund ; NSFC of China ; NSFC of China ; Canada First Research Excellence Fund ; Canada First Research Excellence Fund ; NSFC of China ; NSFC of China ; Canada First Research Excellence Fund ; Canada First Research Excellence Fund ; NSFC of China ; NSFC of China ; Canada First Research Excellence Fund ; Canada First Research Excellence Fund
内容类型	期刊论文
源URL	[http://cas-ir.dicp.ac.cn/handle/321008/167020]
专题	大连化学物理研究所_中国科学院大连化学物理研究所
通讯作者	Liu, Hongwen; Ding, Hong
作者单位	1.Univ Sherbrooke, Inst Quant, 2500 Blvd Univ, Sherbrooke, PQ J1K 2R1, Canada 2.Chinese Acad Sci, Inst Phys, Beijing 100190, Peoples R China 3.Chinese Acad Sci, Dalian Inst Chem Phys, Dalian 116023, Liaoning, Peoples R China 4.Univ Chinese Acad Sci, Sch Phys, Beijing 100190, Peoples R China 5.Collaborat Innovat Ctr Quantum Matter, Beijing 100190, Peoples R China
推荐引用方式 GB/T 7714	Zhang, Guanhua,Liu, Hongwen,Richard, Pierre,et al. Spatially Resolved X-ray Photoemission Electron Microscopy of Weyl Semimetal NbAs[J]. CRYSTAL GROWTH & DESIGN,2018,18(9):5210-5213.
APA	Zhang, Guanhua,Liu, Hongwen,Richard, Pierre,Zhao, Lingxiao,Chen, Gen-Fu,&Ding, Hong.(2018).Spatially Resolved X-ray Photoemission Electron Microscopy of Weyl Semimetal NbAs.CRYSTAL GROWTH & DESIGN,18(9),5210-5213.
MLA	Zhang, Guanhua,et al."Spatially Resolved X-ray Photoemission Electron Microscopy of Weyl Semimetal NbAs".CRYSTAL GROWTH & DESIGN 18.9(2018):5210-5213.