A surface kinetics model for the growth of si1-xgex by uhv/cvd using sih4/ceh4 | |
Yu, Z; Li, DZ; Cheng, BW; Huang, CJ; Lei, ZL; Yu, JZ; Wang, QM; Liang, JW | |
刊名 | Journal of crystal growth |
2000-09-01 | |
卷号 | 218期号:2-4页码:245-249 |
关键词 | Sige/si Epitaxial growth Surface reaction kinetics Uhv/cvd system |
ISSN号 | 0022-0248 |
通讯作者 | Yu, z() |
英文摘要 | The surface reaction mechanism of si1-xgex/si growth using sih4 and geh4 in uhv/cvd system was studied. the saturated adsorption and desorption of sih4 from si(1 0 0) surface was investigated with the help of tpd and rheed, and it was found that all the 4 hydrogen atoms of one sih4 molecule were adsorbed to the si surface, which meant that the dissociated adsorption ratio was proportional to 4 power of surface vacancies. the analysis of the reaction of geh4 was also done. a new surface reaction kinetic model on si1-xgex/si epitaxial growth under uhv conditions by sih4/geh4 was proposed based on these studies. the predictions of the model were verified by the experimental results. (c) 2000 elsevier science b.v. all rights reserved. |
WOS关键词 | CHEMICAL VAPOR-DEPOSITION ; ATOMIC-HYDROGEN ; ADSORPTION ; SI(100) ; SI2H6 ; SIH4 ; MECHANISMS ; DESORPTION ; PHASE ; FILMS |
WOS研究方向 | Crystallography ; Materials Science ; Physics |
WOS类目 | Crystallography ; Materials Science, Multidisciplinary ; Physics, Applied |
语种 | 英语 |
出版者 | ELSEVIER SCIENCE BV |
WOS记录号 | WOS:000089575200016 |
内容类型 | 期刊论文 |
URI标识 | http://www.corc.org.cn/handle/1471x/2428918 |
专题 | 半导体研究所 |
通讯作者 | Yu, Z |
作者单位 | Chinese Acad Sci, Inst Semicond, Beijing 100083, Peoples R China |
推荐引用方式 GB/T 7714 | Yu, Z,Li, DZ,Cheng, BW,et al. A surface kinetics model for the growth of si1-xgex by uhv/cvd using sih4/ceh4[J]. Journal of crystal growth,2000,218(2-4):245-249. |
APA | Yu, Z.,Li, DZ.,Cheng, BW.,Huang, CJ.,Lei, ZL.,...&Liang, JW.(2000).A surface kinetics model for the growth of si1-xgex by uhv/cvd using sih4/ceh4.Journal of crystal growth,218(2-4),245-249. |
MLA | Yu, Z,et al."A surface kinetics model for the growth of si1-xgex by uhv/cvd using sih4/ceh4".Journal of crystal growth 218.2-4(2000):245-249. |
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