The third subband population in modulation-doped ingaas/inalas heterostructures | |
Li, HX; Wang, ZG; Liang, JB; Xu, B; Wu, J; Gong, Q; Jiang, C; Liu, FQ; Zhou, W | |
刊名 | Journal of applied physics |
1997-12-15 | |
卷号 | 82期号:12页码:6107-6109 |
ISSN号 | 0021-8979 |
通讯作者 | Li, hx() |
英文摘要 | We have observed the population of the third (n=3) two-dimensional electron subband of ingaas/ inalas modulation-doped structures with very dense sheet carrier density by means of fourier transform photoluminescence (pl). three well-resolved pl peaks centered at 0.737, 0.908, and 0.980 ev are observed, which are attributed to the recombination transitions from the lowest three electron subbands to the n=1 heavy-hole subband. the subband separations clearly exhibit the features of the stepped quantum well with triangle and square potential, consistent with numerical calculation. thanks to the presence of the fermi cutoff, the population ratio of these three subbands can be estimated. temperature and excitation intensity dependence of the quantum well luminescence intensity is also analyzed. (c) 1997 american institute of physics. |
WOS关键词 | MULTIPLE-QUANTUM WELLS ; PHOTOLUMINESCENCE SPECTROSCOPY ; TRANSISTOR STRUCTURES ; ELECTRON ; TEMPERATURE ; DENSITY |
WOS研究方向 | Physics |
WOS类目 | Physics, Applied |
语种 | 英语 |
出版者 | AMER INST PHYSICS |
WOS记录号 | WOS:000071043400033 |
内容类型 | 期刊论文 |
URI标识 | http://www.corc.org.cn/handle/1471x/2428512 |
专题 | 半导体研究所 |
通讯作者 | Li, HX |
作者单位 | Chinese Acad Sci, Inst Semicond, Lab Semicond Mat Sci, Beijing 10083, Peoples R China |
推荐引用方式 GB/T 7714 | Li, HX,Wang, ZG,Liang, JB,et al. The third subband population in modulation-doped ingaas/inalas heterostructures[J]. Journal of applied physics,1997,82(12):6107-6109. |
APA | Li, HX.,Wang, ZG.,Liang, JB.,Xu, B.,Wu, J.,...&Zhou, W.(1997).The third subband population in modulation-doped ingaas/inalas heterostructures.Journal of applied physics,82(12),6107-6109. |
MLA | Li, HX,et al."The third subband population in modulation-doped ingaas/inalas heterostructures".Journal of applied physics 82.12(1997):6107-6109. |
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