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	Mode analysis for equilateral-triangle-resonator microlasers with metal confinement layers
	Yang, Yue-De; Huang, Yong-Zhen; Wang, Shi-Jiang
刊名	Ieee journal of quantum electronics
	2009-12-01
卷号	45期号:12页码:1529-1536
关键词	Equilateral triangle resonator (etr) Microcavities Microlasers Semiconductor lasers
ISSN号	0018-9197
DOI	10.1109/jqe.2009.2024006
通讯作者	Yang, yue-de()
英文摘要	Mode characteristics are analyzed for electrically injected equilateral-triangle-resonator (etr) semiconductor microlasers, which are laterally confined by insulating barrier sio(2) and electrode metals ti-au. for the etr without metal layers, the totally confined mode field patterns are derived based on the reflection phase shifts, and the q-factors are calculated from the far-field emission of the analytical near field distribution, which are agreement very well with the numerical results of the finite-difference time-domain (fdtd) simulation. the polarization dependence reflections for light rays incident on semiconductor-sio(2) -ti-au multi-layer structures are accounted in considering the confinement of te and tm modes in the etr with the metal layers. the reflectivity will greatly reduce with a ti layer between sio(2) and au for light rays with incident angle less than 30 especially for the te mode, even the thickness of the ti layer is only 10 nm. if the etr is laterally confined by sio(2)-au layers without the ti layer, the fabry-perot type modes with an incident angle of zero on one side of the etr can also have high q-factor. the fdtd simulation for the etr confined by metal layers verifies the above analysis based on multi-layer reflections. the output spectra with mode intervals of whispering-gallery modes and fabry-perot type modes are observed from different etr lasers with side length of 10 m, respectively.
WOS关键词	DIRECTIONAL EMISSION ; SQUARE RESONATORS ; INJECTION-LASERS ; MICRODISK LASERS ; QUALITY FACTOR ; WAVE-GUIDE ; MICROCAVITIES
WOS研究方向	Engineering ; Optics ; Physics
WOS类目	Engineering, Electrical & Electronic ; Optics ; Physics, Applied
语种	英语
出版者	IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC
WOS记录号	WOS:000271488300002
内容类型	期刊论文
URI标识	http://www.corc.org.cn/handle/1471x/2427739
专题	半导体研究所
通讯作者	Yang, Yue-De
作者单位	Chinese Acad Sci, State Key Lab Integrated Optoelect, Inst Semicond, Beijing 100083, Peoples R China
推荐引用方式 GB/T 7714	Yang, Yue-De,Huang, Yong-Zhen,Wang, Shi-Jiang. Mode analysis for equilateral-triangle-resonator microlasers with metal confinement layers[J]. Ieee journal of quantum electronics,2009,45(12):1529-1536.
APA	Yang, Yue-De,Huang, Yong-Zhen,&Wang, Shi-Jiang.(2009).Mode analysis for equilateral-triangle-resonator microlasers with metal confinement layers.Ieee journal of quantum electronics,45(12),1529-1536.
MLA	Yang, Yue-De,et al."Mode analysis for equilateral-triangle-resonator microlasers with metal confinement layers".Ieee journal of quantum electronics 45.12(2009):1529-1536.

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